10.7795/810.20180323C
Bircher, Benjamin A.
Benjamin A.
Bircher
Federal Institute of Metrology METAS, Laboratory for Length, Nano- and Microtechnology, Bern-Wabern, Switzerland
Meli, Felix
Felix
Meli
0000-0001-7575-7540
Federal Institute of Metrology METAS, Laboratory for Length, Nano- and Microtechnology, Bern-Wabern, Switzerland
Küng, Alain
Alain
Küng
Federal Institute of Metrology METAS, Laboratory for Length, Nano- and Microtechnology, Bern-Wabern, Switzerland
Thalmann, Rudolf
Rudolf
Thalmann
Federal Institute of Metrology METAS, Laboratory for Length, Nano- and Microtechnology, Bern-Wabern, Switzerland
Characterising the Positioning System of a Dimensional Computed Tomograph (CT)
Physikalisch-Technische Bundesanstalt (PTB)
2018
en
Physikalisch-Technische Bundesanstalt (PTB)
0000 0001 2186 1887
2017-12-19
2018-03-28
599325 bytes
8 pages
application/pdf
CC BY 4.0
Article
Computed tomography (CT) is increasingly used for dimensional characterisation of workpieces. Therefore, the Federal Institute of Metrology METAS is developing and building a unique metrology CT system to measure workpieces of millimetre dimensions with sub-micrometre resolution, and to study CT metrology and traceability in general. Here, an overview of the CT system is presented and the requirements related to the positioning system and its characterisation are discussed in detail. The results indicate that further in situ measurement systems are required to correct high-resolution CT scans for geometrical errors.
This article is based on a presentation at the conference "MacroScale 2017 - Recent developments in traceable dimensional measurements", VTT MIKES Espoo, (Finnland), 17th-19th October 2017.
Computed tomography (CT)
dimensional metrology
9 DoF CT geometry