10.3929/ETHZ-B-000397313
Volk, Sebastian
Yazdani, Nuri
Yarema, Olesya
Yarema, Maksym
Wood, Vanessa
Dopants and Traps in Nanocrystal-Based Semiconductor Thin Films: Origins and Measurement of Electronic Midgap States
ETH Zurich
2020
Journal Article
Nanocrystal thin films
PbS
trap state
electronic midgap state
Fourier transform photocurrent spectroscopy
FTPS
energy-resolved electrochemical impedance spectroscopy
ER-EIS
2020-02-25
en
7 p.
application/pdf
http://rightsstatements.org/page/InC-NC/1.0/
info:eu-repo/semantics/openAccess
ACS Applied Electronic Materials, 2 (2)
ISSN:2637-6113