10.25920/0xv3-8459
Ziatdinov, Maxim
Maxim
Ziatdinov
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory
Dyck, Ondrej
Ondrej
Dyck
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory
Kalinin, Sergei V.
Sergei
Kalinin
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory
Sumpter, Bobby G.
Bobby
Sumpter
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory
Si-Vacancy complexes in Graphene
Citrine Informatics
2018
Graphene
Vacancy
Silicon
Scanning Transmission Microscopy
en
Dataset
1.0
Scanning transmission electron microscopy of Si-vacancy complexes in monolayer graphene
Dynamic electron beam-induced transformations are used to create libraries of the possible Si and carbon vacancy defects in graphene monolayer. Automated image analysis and recognition based on deep learning networks is developed to identify and categorize the defects, creating a library of (meta) stable defect configurations.
Department of Energy
Oak Ridge National Laboratory, Laboratory Directed Research and Development Program