10.23689/FIDGEO-833
Bunge, H. J.
Klein, H.
Wcislak, L.
Garbe, U.
Weiß, W.
Schneider, J. R.
High-Resolution Imaging of Texture and Microstructure by the Moving Detector Method
FID GEO
2003
FID GEO
FID GEO
2010-11-24
2010-11-24
2003
eng
Article
Textures and Microstructures; Vol. 35.2003, No. 3/4, p. 253-271
http://hdl.handle.net/11858/00-1735-0000-0001-33F7-4
10.23689/fidgeo-833
571819583
In order to describe texture and microstructure of a polycrystalline material completely, crystal orientation g={?1F?2} must be known in all points x={x1?x2?x3} of the material. This can be achieved by locationresolved diffraction of high-energy, i.e. short-wave, X-rays from synchrotron sources. Highest resolution in the orientation- as well as the location-coordinates can be achieved by three variants of a detector sweeping technique in which an area detector is continuously moved during exposure. This technique results in two-dimensionally continuous images which are sections and projections of the six-dimensional orientation location space. Further evaluation of these images depends on whether individual grains are resolved in them or not. Because of the high penetration depth of high-energy synchrotron radiation in matter, this technique is also, and particularly, suitable for the investigation of the interior of big samples.
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