10.18419/opus-4887
Marx, Dieter
Buck, Jochen
Lassmann, Kurt
Eisenmenger, Wolfgang
Reflection of high frequency phonons at free silicon surfaces
Universität Stuttgart
1978
Phonon , Silicium
530
Universität Stuttgart
Universität Stuttgart
2009-10-07
2016-03-31
2009-10-07
2016-03-31
1978
2014-09-11
en
article
317914251
http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-46898
http://elib.uni-stuttgart.de/handle/11682/4904
In reflection experiments at free silicon [100]-surfaces we could distinguish between specularly and diffusely reflected transverse phonons propagated along <100>-directions. With increasing phonon frequency the number of diffusely scattered phonons increase relative to that of specularly reflected phonons.