10.17863/CAM.58559
Smith, Luke
0000-0003-2194-4708
Batey, Jack O
Alexander-Webber, Jack A
Fan, Ye
0000-0003-0998-5881
Hsieh, Yu-Chiang
Fung, Shin-Jr
Jevtics, Dimitars
Robertson, Joshua
Guilhabert, Benoit JE
Strain, Michael J
Dawson, Martin D
Hurtado, Antonio
Griffiths, Jonathan P
Beere, Harvey E
Jagadish, Chennupati
Burton, Oliver J
Hofmann, Stephan
0000-0001-6375-1459
Chen, Tse-Ming
Ritchie, David A
Kelly, Michael
Joyce, Hannah J
Smith, Charles G
Research data supporting ‘High-Throughput Electrical Characterisation of Nanomaterials From Room to Cryogenic Temperatures’
Apollo - University of Cambridge Repository
2020
Nanoelectronic device arrays
Scalable fabrication
High-throughput testing
Graphene and 2D materials
Nanowires
Electronic characterisation
Apollo - University of Cambridge Repository
Apollo - University of Cambridge Repository
Smith, Charles G
2020-10-16
2020-10-16
Dataset
https://www.repository.cam.ac.uk/handle/1810/311600
10.1021/acsnano.0c05622
https://www.repository.cam.ac.uk/handle/1810/311451
Attribution 4.0 International (CC BY 4.0)
Measurements are performed using electrical methods described in the paper. Data to generate all plots in the associated publication are contained within the zipped file as separate ‘.txt’ files. The README.txt file contains information about each separate file.
Engineering and Physical Sciences Research Council
EP/R029075/1
Engineering and Physical Sciences Research Council
EP/P005152/1
Engineering and Physical Sciences Research Council
EP/M508007/1
Engineering and Physical Sciences Research Council
EP/R03480X/1