10.15480/882.1158
Neusel, Claudia
Claudia
Neusel
1144916283
Schneider, Gerold A.
Gerold A.
Schneider
0000-0001-5780-6249
113530839X
Size-dependence of the dielectric breakdown strength from nano- to millimeter scale
TUHH Universitätsbibliothek
2013
Dickenabhängigkeit
Permittivität
Breakdown strength
ceramics
polymers
thickness-dependence
permittivity-dependence
Elektrischer Durchschlag
Keramischer Werkstoff
Polymere
Dicke
Dielektrizitätszahl
620
TUHH Universitätsbibliothek
TUHH Universitätsbibliothek
2014-02-27
2014-02-27
2013
2014-04-01
en
Working Paper
Journal of the Mechanics and Physics of Solids ; 63.2014, Feb., S. 201 – 213
781993563
http://tubdok.tub.tuhh.de/handle/11420/1160
urn:nbn:de:gbv:830-tubdok-12571
10.15480/882.1158
11420/1160
930768309
http://doku.b.tu-harburg.de/doku/lic_mit_pod.php
Dielectric breakdown decisively determines the reliability of nano- to centimeter sized electronic devices and components. Nevertheless, a systematic investigation of this phenomenon over the relevant lengths scales and materials classes is still missing. Here, the thickness and permittivity-dependence of the dielectric breakdown strength of insulating crystalline and polymer materials from the millimeter down to the nanometer scale is investigated. While the dependence of breakdown strength on permittivity was found to be thickness-independent for materials in the nm-mm range, the magnitude of the breakdown strength was found to change from a thickness-independent, intrinsic regime, to a thickness-dependent, extrinsic regime. The transition-thickness is interpreted as the characteristic length of a breakdown-initiating conducting filament. The results are in agreement with a model, where the dielectric breakdown strength is defined in terms of breakdown toughness and length of a conducting filament.